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SNIFT

SNIFT is specialised in near-field test ranges, with the primary function to perform fast and accurate transformations of an antenna’s field from one imaginary spherical surface to another, with the far-field sphere being a special case.

Why SNIFT

Allows full or parial sphere input data

Input your full sphere or partial sphere data easily

Symmetric probe correction

Full correction for axially symmetric (m=±1) probes

Industry probe correction standard

Use the industry standard for spherical near-field to far-field transformation with probe correction

Implementation independency

Independent of the actual measurement system implementation

Transform and self-stabilise fast

Fast Fourier Transformation and self-stabilising recurrence relations allow handling of even very large antenna structures

  • Short transformation time
  • Non-Maxwellian measurement inaccuracies are averaged to physically correct output
  • Noise reduction by means of high-order spherical mode filtering
  • Mathematically exact pattern transformation
  • The output coordinate system may be rotated to coincide with the peak direction of the far field, which is not always coinciding with any of the measurement coordinate system axes

Everything you need – in one environment.

Spherical wave coefficients

Rotation of the spherical wave coefficients

If only a certain region of the antenna pattern has interest, it is possible to perform truncated measurements and still use SNIFT for the transformation. The transformed data are referred to the measurement coordinate system, but if, for example, the region of interest does not coincide with this system (e.g. a scanned beam), the supplementary program ROSCOE can be applied to do the appropriate coordinate transformation into a system centered around the peak.

Accurate spherical harmonics

Accurate determination of spherical harmonics

Well-founded choice of numerical implementation ensures a very stable algorithm, also for high-order harmonics. Antennas with diameters exceeding several hundred wavelengths are handled within seconds on a standard PC with accurate determination of all involved spherical harmonics.


Downloads

Technical documentation and resources for SNIFT. Open files download directly; the rest are available to customers with a portal account.

Array 3Requires access
Is it possible to use more than one type of element in an array?

Yes, both the full-wave and analytical arrays support mixing any number of different array elements.

Is it possible to use more than one type of element in an array?

Yes, both the full-wave and analytical arrays support mixing any number of different array elements.

Is it possible to use more than one type of element in an array?

Yes, both the full-wave and analytical arrays support mixing any number of different array elements.

Is it possible to use more than one type of element in an array?

Yes, both the full-wave and analytical arrays support mixing any number of different array elements.

Is it possible to use more than one type of element in an array?

Yes, both the full-wave and analytical arrays support mixing any number of different array elements.

Is it possible to use more than one type of element in an array?

Yes, both the full-wave and analytical arrays support mixing any number of different array elements.

Is it possible to use more than one type of element in an array?

Yes, both the full-wave and analytical arrays support mixing any number of different array elements.

Contact us

Louise Andersson

Marketing Manager

+45 33 30 67 54 la@ticra.com
Louise Andersson

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